In serial scan design, test pattern application & test response acquisition are both conducted serially through sca…

Partial-scan design only requires that a subset of storage elements be replaced with scan cells and connected into scan…

In full-scan design, all storage elements are replaced with scan cells, which are then configured as one or more shift …

There are three popular scan architectures. These scan architectures include:  Full-Scan Design :  Where all storag…

The structured DFT approach attempts to improve the overall testability of a circuit with  a test-oriented design …

What is TPI? Test Point Insertion (TPI) is a commonly used Ad hoc DFT technique for improving the controllability a…

In the context of testability analysis, topology based methods like SCOAP  and probability based methods are stat…

SCOAP and probability based testability analysis has their own formula to determine the controllability and observ…

Instead of deterministic testability in advance, random testability of a logic circuit can be analyzed using probabilit…

The Sandia Controllability/Observability Analysis Program (SCOAP) was the first topology-based program that popula…

At first, we should know what is testability. Testability is the ability to put a design into a known initial state, an…

Delay Faults With decreasing feature sizes and increasing signal speeds, the problem of modeling gate delays become…

What Are Bridging Faults? When a short develops between two unconnected signal lines of a logic gate, bridging faul…

What Are Transistor Faults? At transistor level, a transistor may be stuck-short or stuck-open. In stuck-short, a t…

What Are Stuck At Faults When a line is permanently connected to Vdd or ground, a stuck at fault occurs, resulting …

Test Generation If the circuit under test (CUT) is an n input combinational logic circuit, we can apply all  2 n   …

What is Design For Testability (DFT)? Before understanding Design for Testability, we should know what is manufactu…

A deep submicron devices contain a large number of memories which demands lower area and fast access time, hence an…