SCOAP and probability based testability analysis has their own formula to determine the controllability and observability of the inputs and outputs of all the gates. So, where is the difference?
The difference is in the concept of controllability and observability. For the SCOAP method if the value of controllability and observability is higher, then it is harder to control or observe a certain fault. If the value is very high then the fault might go undetected. And for the probability-based testability method if the probability of controlling and observing a certain value or point is low, then it is harder to detect any stuck-at fault at that point. If the probability is very low, the fault might be considered undetected.
Here, I have calculated the controllability, observability and probability for both the SCOAP and probability based testability analysis method for the same full adder circuit.
See also: Testability analysis, SCOAP method, Probability based testability analysis
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