Scan Architectures

There are three popular scan architectures. These scan architectures include: 

• Full-Scan Design: 

Where all storage elements are converted into scan cells and combinational ATPG is used for test generation. Click here to read the full post about Full-scan Design architecture.

• Partial-Scan Design: 

Where a subset of storage elements is converted into scan cells and sequential ATPG is typically used for test generation. Click here to read the full post about Partial-scan Design architecture.

• Random-Access Scan Design: 

A random addressing mechanism, instead of serial scan chains, is used to provide direct access to read or write any scan cell. Click here to read the full post about Random-Access scan Design architecture.

See Also: Full scan design, Partial scan design, Random access scan design, Muxed D scan cell