In serial scan design, test pattern application & test response acquisition are both conducted serially through sca…

Partial-scan design only requires that a subset of storage elements be replaced with scan cells and connected into scan…

In full-scan design, all storage elements are replaced with scan cells, which are then configured as one or more shift …

There are three popular scan architectures. These scan architectures include:  Full-Scan Design :  Where all storag…

The structured DFT approach attempts to improve the overall testability of a circuit with  a test-oriented design …

What is TPI? Test Point Insertion (TPI) is a commonly used Ad hoc DFT technique for improving the controllability a…

In the context of testability analysis, topology based methods like SCOAP  and probability based methods are stat…